NI PXIe-6556

Technical Specifications: Digital Channels: 24 channels with per-pin PPMU Clock Rate: 200 MHz Programmable Drive Voltage Range: -2 V to 6 V or -1 V to 7 V selectable Voltage Resolution: 122 μV Channel Output Impedance: 50 Ω nominal Per Channel DC Drive Current: ±35 mA nominal PPMU Measurement Current Sensitivity: 20 nA

Function Features: Independent direction control per channel. Per-pin parametric measurement unit for continuity, leakage and DC parametric test. 5 ns edge placement resolution. FPGA-based custom trigger and marker logic. Pattern memory per data channel.

Application Scenarios: Semiconductor mixed-signal device test, IC pin parametric characterization, high-speed digital pattern test, system-on-chip validation, multi-pin device continuity and leakage test.

Material Composition: Front panel: aluminum alloy. PCB: high-density high-speed controlled impedance multi-layer board. Pin electronics driver and PMU measurement circuits. VHDCI connector.

Structural Features: 3U single-slot PXIe module. Each channel independent pin electronic circuit. Onboard large pattern memory.

Working Principle: Onboard memory stores digital test patterns. Pin electronics drive digital signals with programmable voltage and timing. Per-pin PPMU sources or measures DC voltage and current on each DUT pin to capture parametric characteristics. Hardware comparator detects digital output failure.

Installation Requirements: Install into PXIe chassis slot. Use SHC68-C68-D4 cable. Install NI-HSDIO driver. Run self-calibration before parametric measurement.

Usage Notes: Respect per-channel current and total power limits. Use 1 m recommended cable. Warm-up required before precision parametric measurement. Protect pins from electrostatic discharge during device connection.