LAM 810-068158-014

Product Name: LAM Research 810-068158-014 — Gas Distribution Showerhead (300 mm, Dual-Frequency)

Product Overview: A dual-frequency (2 MHz + 13.56 MHz) gas showerhead assembly for LAM etch chambers, enabling independent control of ion energy and plasma density.

Category:
Description

Technical Specifications:

  • Type: Dual-Frequency Gas Showerhead
  • Diameter: 300 mm
  • Frequency: 2 MHz (source power) + 13.56 MHz (bias power)
  • Number of Gas Zones: 3 ~ 7 zones (customizable)
  • Material: Anodized Aluminum (6061-T6) body, Y₂O₃ or Al₂O₃ coated surface
  • Operating Temperature: Up to 250°C

Functional Features:

  • Independent RF power control — 2 MHz controls plasma density, 13.56 MHz controls ion energy
  • Multi-zone gas delivery enables radial etch uniformity tuning
  • Coated interior surface reduces particle generation and fluorine attack

Performance Parameters:

Parameter Value
RF Power (2 MHz) 0 ~ 5000 W
RF Power (13.56 MHz) 0 ~ 3000 W
Gas Zones 3 / 5 / 7 (configurable)
Gas Types CF₄, CHF₃, Cl₂, HBr, O₂, Ar, N₂, etc.
Pressure Range 1 ~ 100 mTorr
Particle Rating < 50 particles > 0.3 µm per wafer (post-clean)

Material Composition:

  • Body: 6061-T6 Aluminum Alloy, hard anodized
  • Coating: Yttrium Oxide (Y₂O₃) or Alumina (Al₂O₃) plasma spray
  • Seals: Viton or Kalrez O-rings
  • Fasteners: Stainless Steel 316L

Structural Features:

  • Circular plate with precision-drilled gas holes (0.5 ~ 1.0 mm diameter)
  • Internal gas manifold with zone-isolated channels
  • RF electrode embedded or capacitively coupled

Working Principle: Process gases enter through the showerhead and are distributed uniformly across the wafer surface via the multi-zone hole pattern. The dual-frequency RF power creates a high-density plasma (2 MHz) while independently controlling ion bombardment energy (13.56 MHz), enabling decoupled etch rate and anisotropy control.

Advantages:

  • Decoupled etch rate and ion energy control — critical for advanced node patterning
  • Excellent within-wafer uniformity (< 2% WIWNU achievable)
  • Y₂O₃ coating provides superior erosion resistance vs. bare Al

Applicable Industries: Semiconductor — Advanced Logic Etch, DRAM Etch, 3D NAND Etch, FinFET Processing

Model Series: LAM 810-068xxx Series — 300 mm Dual-Freq Showerhead

Installation Requirements:

  • Align to chamber ceiling with precision pins
  • Connect all gas lines with Swagelok fittings
  • Connect 2 MHz and 13.56 MHz RF lines with 50 Ω impedance matching
  • Perform leak check at 100 mTorr with N₂

Usage Notes:

  • Clean interior surfaces every 10,000 wafers using NF₃ plasma
  • Replace O-rings every 6 months or 30,000 wafers
  • Do not exceed 5000 W at 2 MHz to prevent coating delamination
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