WAVECREST DTS‑2079

Technical Specifications: Measurement channels: 2 independent input channels; input frequency range: DC to 3 GHz; time measurement resolution: sub‑picosecond level; measurement range: nanosecond to second level; input impedance: 50 Ω; trigger level range: ‑2 V to +2 V adjustable; interface: GPIB, RS‑232, USB; operating temperature: 0 °C ~ +45 °C; power supply: 100‑240 V AC, 50/60 Hz.

Functional Features: High‑precision time interval measurement; clock jitter analysis and statistical calculation; pulse width, period, rise/fall time measurement; built‑in statistical analysis function; support histogram display of measurement results; external reference clock input; automatic calibration function; multiple trigger modes; support remote control via standard bus.

Application Scenarios: High‑speed digital circuit R&D testing; communication equipment clock performance verification; semiconductor device timing parameter testing; optical module signal jitter detection; aerospace electronic equipment timing calibration; precision instrument metrology and calibration.

Performance Parameters: Time measurement accuracy reaches picosecond level; long‑term measurement stability meets laboratory metrology requirements; input channel bandwidth supports high‑speed serial signal testing; statistical function supports mass data jitter distribution analysis; complies with relevant electronic measuring instrument accuracy standards.

Material Composition: Housing: metal sheet‑metal chassis; panel: aluminum alloy front panel with display and operation buttons; internal circuit: high‑frequency PCB, dedicated time‑measurement ASIC chip, high‑stable crystal oscillator; input connector: SMA high‑frequency coaxial connector; power supply module: industrial switching power supply.

Structural Characteristics: Standard bench‑top instrument structure; front panel with LCD display screen and physical operation keys; front‑end SMA coaxial input connectors; rear panel with communication interfaces and power interface; built‑in shielding structure to reduce electromagnetic interference; internal modular layout of power supply, measurement circuit and processing unit.

Working Principle: The input signal enters the high‑speed comparator through the SMA interface to generate a shaped edge signal; the internal high‑precision time‑to‑digital conversion circuit converts the time interval between signal edges into digital quantity; the processor performs statistical calculation and jitter analysis on the measurement data, and outputs the results to the display or transmits them to the host computer through the communication interface.

Installation Requirements: Place on a stable test bench horizontally; connect the power supply to a grounded AC outlet; connect the test signal to the SMA input port via a 50 Ω coaxial cable; connect the communication cable according to the remote control requirement; preheat for 30 minutes before precision measurement; ensure good grounding of the instrument.

Usage Notes: Avoid strong electromagnetic interference and mechanical vibration environment; do not input signals exceeding the rated voltage range; use matched 50 Ω coaxial cables and connectors; perform regular calibration to ensure measurement accuracy; prevent dust and liquid from entering the inside of the instrument; do not block the ventilation holes on the chassis.